TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announced that it has developed semi-in-lens versions (i)/(is) which are optimal for the observation of semiconductor devices ...
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TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951)(President & COO Izumi Oi) announces the development and release of a new scanning electron microscope (SEM), the JSM-IT510 series, in November 2021.
The JEOL 2100F is a multipurpose, 200-kV Field Emission - Transmission Electron Microscope (FE-TEM). The FE electron gun (FEG) produces a highly stable and bright electron probe that cannot be ...
July 14, 2012. JEOL at Semicon West introduced a new NeoScope scanning electron microscope (SEM), which offers higher magnification than the original NeoScope bench-top version, introduced in 2008.
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