Keysight Introduces Scalable, Modular, All-in-One Testing Solution to Accelerate High-Volume PCBA Manufacturing

Compact, modular system with integrated multi-test capability and up to 20-core parallel testing for high-volume efficiency.
Semiconductor Engineering

Parallel RF Test For Next-Generation Communications

The test economics of state-of-the-art smartphones, tablets and routers demand highly parallel RF test. We are addressing this next wave in RF communications test, enabled by Wi-Fi 6E, operating in ...
Nasdaq

Keysight’s New Parallel Parametric Test System Delivers High Throughput and Cost-Effective Wafer Test

SANTA ROSA, Calif.--(BUSINESS WIRE)-- Keysight Technologies, Inc. (NYSE: KEYS), a leading technology company that delivers advanced design and validation solutions to help accelerate innovation to ...
Nasdaq

Keysight Introduces Massively Parallel Board Test System to Enable Higher Throughput in a Smaller Footprint

SANTA ROSA, Calif.--(BUSINESS WIRE)-- Keysight Technologies, Inc. (NYSE: KEYS), a leading technology company that helps enterprises, service providers and governments accelerate innovation to connect ...
EDN

Open’ ATE platforms must support parallel test

There is considerable ongoing discussion on how to contain exponentially increasing test costs for systems-on-chip (SoCs) and microprocessors. As the transistor geometry shrinks and more transistors ...
Electronic Design

Parallel Processing Techniques Reduce Cellular Test Time

According to several recent market studies, roughly 750 million cellular handsets were shipped in 2006. This quantity is likely to increase to more than one billion handsets by 2011. These numbers are ...
EDN

Open architecture supports parallel test

As the transistor geometry shrinks, more transistors are packed on to a single chip, reducing manufacturing cost on a per-transistor basis. The result, however, is more transistors to test; hence, ...